%$Header$ \chapter{\cberzerolongtitle{}} \label{cber0} \section{Corrupted Software Build Output} A recent article in \emph{Scientific American} highlighted that data transfers and RAM contents in computers were vulnerable to errors. During the single build of an embedded software load, how large is the probability that the build output will be corrupted, and does this probability justify any special build procedures, especially when MROM is involved? %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% \noindent\begin{figure}[!b] \noindent\rule[-0.25in]{\textwidth}{1pt} \begin{tiny} \begin{verbatim} $HeadURL$ $Revision$ $Date$ $Author$ \end{verbatim} \end{tiny} \noindent\rule[0.25in]{\textwidth}{1pt} \end{figure} %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% % %End of file C_BER0.TEX