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%$Header$ |
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\chapter{\cberzerolongtitle{}} |
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\label{cber0} |
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\section{Corrupted Software Build Output} |
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A recent article in \emph{Scientific American} |
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highlighted that data transfers and RAM contents in computers |
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were vulnerable to errors. During the single build of |
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an embedded software load, how large is the probability |
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that the build output will be corrupted, and does this |
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probability justify any special build procedures, especially when |
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MROM is involved? |
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% |
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\noindent\begin{figure}[!b] |
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\noindent\rule[-0.25in]{\textwidth}{1pt} |
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\begin{tiny} |
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\begin{verbatim} |
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$HeadURL$ |
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$Revision$ |
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$Date$ |
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$Author$ |
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\end{verbatim} |
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\end{tiny} |
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\noindent\rule[0.25in]{\textwidth}{1pt} |
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\end{figure} |
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% |
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% |
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%End of file C_BER0.TEX |