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%$Header: /home/dashley/cvsrep/e3ft_gpl01/e3ft_gpl01/dtaipubs/esrgubka/c_hrq0/c_hrq0.tex,v 1.2 2001/07/01 20:34:52 dtashley Exp $
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\chapter{\chrqzerolongtitle{}}
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\label{chrq0}
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\section{Corruption Due To Electrical Transients}
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Microcontrollers are vulnerable to state upset
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from electrical transients. Need more
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information in this area.
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\noindent\begin{figure}[!b]
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\noindent\rule[-0.25in]{\textwidth}{1pt}
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\begin{tiny}
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\begin{verbatim}
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$RCSfile: c_hrq0.tex,v $
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$Source: /home/dashley/cvsrep/e3ft_gpl01/e3ft_gpl01/dtaipubs/esrgubka/c_hrq0/c_hrq0.tex,v $
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$Revision: 1.2 $
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$Author: dtashley $
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$Date: 2001/07/01 20:34:52 $
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\end{verbatim}
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\end{tiny}
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\noindent\rule[0.25in]{\textwidth}{1pt}
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\end{figure}
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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% $Log: c_hrq0.tex,v $
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% Revision 1.2 2001/07/01 20:34:52 dtashley
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% Move out of binary mode for use with CVS.
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%
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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% $History: c_hrq0.tex $
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%
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% ***************** Version 2 *****************
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% User: Dashley1 Date: 12/22/00 Time: 12:55a
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% Updated in $/uC Software Multi-Volume Book (A)/Chapter, HRQ0, Hardware Research Questions
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% Tcl automated method of build refined.
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%
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% ***************** Version 1 *****************
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% User: David T. Ashley Date: 7/19/00 Time: 12:22a
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% Created in $/uC Software Multi-Volume Book (A)/Chapter, HRQ0, Hardware Research Questions
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% Initial check-in.
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%
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%End of file C_HRQ0.TEX
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