%$Header: /home/dashley/cvsrep/e3ft_gpl01/e3ft_gpl01/dtaipubs/esrgubka/c_hrq0/c_hrq0.tex,v 1.2 2001/07/01 20:34:52 dtashley Exp $ \chapter{\chrqzerolongtitle{}} \label{chrq0} \section{Corruption Due To Electrical Transients} Microcontrollers are vulnerable to state upset from electrical transients. Need more information in this area. %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% \noindent\begin{figure}[!b] \noindent\rule[-0.25in]{\textwidth}{1pt} \begin{tiny} \begin{verbatim} $RCSfile: c_hrq0.tex,v $ $Source: /home/dashley/cvsrep/e3ft_gpl01/e3ft_gpl01/dtaipubs/esrgubka/c_hrq0/c_hrq0.tex,v $ $Revision: 1.2 $ $Author: dtashley $ $Date: 2001/07/01 20:34:52 $ \end{verbatim} \end{tiny} \noindent\rule[0.25in]{\textwidth}{1pt} \end{figure} %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% % $Log: c_hrq0.tex,v $ % Revision 1.2 2001/07/01 20:34:52 dtashley % Move out of binary mode for use with CVS. % %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% % $History: c_hrq0.tex $ % % ***************** Version 2 ***************** % User: Dashley1 Date: 12/22/00 Time: 12:55a % Updated in $/uC Software Multi-Volume Book (A)/Chapter, HRQ0, Hardware Research Questions % Tcl automated method of build refined. % % ***************** Version 1 ***************** % User: David T. Ashley Date: 7/19/00 Time: 12:22a % Created in $/uC Software Multi-Volume Book (A)/Chapter, HRQ0, Hardware Research Questions % Initial check-in. % %End of file C_HRQ0.TEX