# Contents of /pubs/books/ucbka/trunk/c_hrq0/c_hrq0.tex

Initial commit after migrating from CVS.

 1 %$Header: /home/dashley/cvsrep/e3ft_gpl01/e3ft_gpl01/dtaipubs/esrgubka/c_hrq0/c_hrq0.tex,v 1.2 2001/07/01 20:34:52 dtashley Exp$ 2 3 \chapter{\chrqzerolongtitle{}} 4 5 \label{chrq0} 6 7 8 \section{Corruption Due To Electrical Transients} 9 10 Microcontrollers are vulnerable to state upset 11 from electrical transients. Need more 12 information in this area. 13 14 15 %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% 16 17 \noindent\begin{figure}[!b] 18 \noindent\rule[-0.25in]{\textwidth}{1pt} 19 \begin{tiny} 20 \begin{verbatim} 21 $RCSfile: c_hrq0.tex,v$ 22 $Source: /home/dashley/cvsrep/e3ft_gpl01/e3ft_gpl01/dtaipubs/esrgubka/c_hrq0/c_hrq0.tex,v$ 23 $Revision: 1.2$ 24 $Author: dtashley$ 25 $Date: 2001/07/01 20:34:52$ 26 \end{verbatim} 27 \end{tiny} 28 \noindent\rule[0.25in]{\textwidth}{1pt} 29 \end{figure} 30 31 %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% 32 % $Log: c_hrq0.tex,v$ 33 % Revision 1.2 2001/07/01 20:34:52 dtashley 34 % Move out of binary mode for use with CVS. 35 % 36 %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% 37 % $History: c_hrq0.tex$ 38 % 39 % ***************** Version 2 ***************** 40 % User: Dashley1 Date: 12/22/00 Time: 12:55a 41 % Updated in $/uC Software Multi-Volume Book (A)/Chapter, HRQ0, Hardware Research Questions 42 % Tcl automated method of build refined. 43 % 44 % ***************** Version 1 ***************** 45 % User: David T. Ashley Date: 7/19/00 Time: 12:22a 46 % Created in$/uC Software Multi-Volume Book (A)/Chapter, HRQ0, Hardware Research Questions 47 % Initial check-in. 48 % 49 %End of file C_HRQ0.TEX