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%$Header: /home/dashley/cvsrep/e3ft_gpl01/e3ft_gpl01/dtaipubs/esrgubka/c_soc1/c_soc1.tex,v 1.7 2002/04/21 22:50:04 dtashley Exp $
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\chapter[\csoconeshorttitle{}]{\csoconelongtitle{}}
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\label{csoc1}
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\beginchapterquote{``Anything is possible if you don't know what you're talking
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about.''}
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{Unknown}
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\section{Introduction}
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%Section tag: INT0
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\label{csoc1:sint0}
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\section{Potentiometers}
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%Section tag: pot0
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\label{csoc1:spot0}
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\section{Ratiometric Conversion And Measurement Systems}
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%Section tag: RCS0
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\label{csoc1:srcs0}
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\subsection{Introduction}
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%Section tag: INT0
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\label{csoc1:srcs0:sint0}
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\subsection{Observation Error Due To A/D Quantization}
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%Subsection tag: OEQ0
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\label{csoc1:srcs0:soeq0}
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\index{quantization error}
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The software which executes on a microcontroller is inherently digital
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and can accept as input only digital data. Analog signals must first be
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converted to integers using an \index{A/D converter}A/D converter, and
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such a conversion always introduces \index{quantization error}quantization
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error as a voltage which is conceptually real is mapped to
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$\vworkintsetnonneg{}$. Any such quantization errors are compounded when
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more than one quantized value is used to attempt to infer potentiometer
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position.
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The chief emphasis of this section is the analysis of error due to the
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use of multiple quantized inputs in an attempt to infer a potentiometer
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position.
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\subsubsection{Prototype System I}
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%Subsubsection tag: OEQ0
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\label{csoc1:srcs0:soeq0:spsa0}
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In this section we consider the system shown in
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Figure~\ref{fig:csoc1:srcs0:soeq0:spsa0:01}.
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The figure represents
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the simplest system which may present quantization
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analysis difficulties. Subsequent sections will analyze
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the quantization error of more difficult systems.
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Table~\ref{tbl:csoc1:srcs0:soeq0:spsa0:01} defines the
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variables used in
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Figure~\ref{fig:csoc1:srcs0:soeq0:spsa0:01} and for
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analysis in this section.
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\begin{figure}
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\centering
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\includegraphics[width=4.6in]{c_soc1/prcs001.eps}
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\caption{Prototype Ratiometric Conversion System I}
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\label{fig:csoc1:srcs0:soeq0:spsa0:01}
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\end{figure}
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\begin{table}
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\begin{center}
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\begin{tabular}{|c|l|}
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\hline
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Variable & Description \\
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\hline
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\hline
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$\alpha$ & Potentiometer position, parameterized through $0\leq\alpha\leq 1$. \\
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& $\alpha=0$ is defined to be the potentiometer position \\
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& that produces the lowest voltage at the A/D pin, and \\
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& $\alpha=1$ is defined to be the potentiometer position \\
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& that produces the highest voltage at the A/D pin. \\
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\hline
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$\overline{\alpha}$
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& The estimate of potentiometer position, which may \\
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& contain error because of quantization error introduced \\
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& by A/D conversion. \\
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\hline
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$N_{ADP}$ & The number of A/D counts (supplied to software by an \\
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& A/D converter) corresponding to the sensing of the \\
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& potentiometer position $\alpha$. \\
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\hline
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$\overline{N_{ADP}}$
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& $N_{ADP}$ with no quantization error. \\
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\hline
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$N_{ADS}$ & The number of A/D counts (supplied to software by an \\
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& A/D converter) corresponding to the sensing of the \\
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& supply voltage $V_S$. \\
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\hline
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$\overline{N_{ADS}}$
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& $N_{ADS}$ with no quantization error. \\
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\hline
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$R_P$ & The resistance (in Ohms) of the variable potentiometer \\
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& whose wiper position $\alpha$ is to be sensed (see \\
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& Figure~\ref{fig:csoc1:srcs0:soeq0:spsa0:01}). Note that this resistance does not appear \\
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& in the analysis of the circuit of Figure~\ref{fig:csoc1:srcs0:soeq0:spsa0:01}, as only \\
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& the potentiometer wiper position $\alpha$ affects $V_{ADP}$. \\
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\hline
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$r_{ADP}$ & The A/D converter ratio (from volts to counts) \\
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& implemented by A/D converter monitoring the variable \\
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& potentiometer input. Note that $N_P = r_{ADP} V_{ADP}$. \\
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\hline
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$r_{ADS}$ & The A/D converter ratio (from volts to counts) \\
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& implemented by A/D converter monitoring the $V_S$ input. \\
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& Note that $N_S = r_{ADS} V_{ADS}$. \\
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\hline
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$V_{ADP}$ & The voltage supplied to the microcontroller or A/D \\
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& converter corresponding to the variable potentiometer\\
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& position $\alpha$. In the system of Figure~\ref{fig:csoc1:srcs0:soeq0:spsa0:01}, $V_{ADP} = \alpha V_S$.\\
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\hline
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$V_{ADS}$ & The voltage supplied to the microcontroller or A/D \\
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& converter corresponding to supply voltage $V_S$. In \\
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& the system of Figure~\ref{fig:csoc1:srcs0:soeq0:spsa0:01}, $V_{ADS}=V_S$. \\
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\hline
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$V_S$ & The supply voltage, presumed variable, which can be \\
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& sensed by the microcontroller software, and also \\
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& drives the high side of the variable potentiometer. \\
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\hline
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\end{tabular}
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\end{center}
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\caption{Variables Used In Analysis Of Prototype System I
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(Figure~\ref{fig:csoc1:srcs0:soeq0:spsa0:01})}
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\label{tbl:csoc1:srcs0:soeq0:spsa0:01}
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\end{table}
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To analyze the system depicted in Figure~\ref{fig:csoc1:srcs0:soeq0:spsa0:01},
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first note that
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:01}
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V_{ADS} = V_S
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\end{equation}
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\noindent{}and
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:02}
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V_{ADP} = \alpha V_S.
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\end{equation}
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For simplicity of analysis, we assume that A/D converters quantize by
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truncation, so that
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:03}
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N_{ADS} = \lfloor V_S r_{ADS} \rfloor
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\end{equation}
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\noindent{}and
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:04}
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N_{ADP} = \lfloor \alpha V_S r_{ADP} \rfloor.
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\end{equation}
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\noindent{}The assumption that A/D converters quantize by truncation
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has little effect on the error analysis of practical systems. (Need
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to include an exercise to show this.)
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To aid in symbolic manipulation, we also introduce
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$\overline{N_{ADS}}$ and $\overline{N_{ADP}}$, which are
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$N_{ADS}$ and $N_{ADP}$, respectively,
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without quantization error:
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:03b}
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\overline{N_{ADS}} = V_S r_{ADS}
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\end{equation}
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:04b}
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\overline{N_{ADP}} = \alpha V_S r_{ADP}
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\end{equation}
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If quantization were not present (i.e. if Eqns.
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\ref{eq:csoc1:srcs0:soeq0:spsa0:03}
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and
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\ref{eq:csoc1:srcs0:soeq0:spsa0:04}
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did not include floor functions), the potentiometer wiper position
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$\alpha$ could be calculated exactly as:
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:05}
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\alpha = \frac{\overline{N_{ADP}} r_{ADS}}{\overline{N_{ADS}} r_{ADP}}.
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\end{equation}
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Based on (\ref{eq:csoc1:srcs0:soeq0:spsa0:05}),
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it makes sense to calculate $\overline{\alpha}$, the
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estimate of $\alpha$, as:
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:05b}
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\overline{\alpha}
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=
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\frac{N_{ADP} r_{ADS}}{N_{ADS} r_{ADP}}.
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\end{equation}
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The question that must be posed is:
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\emph{How different from $\alpha$ can $\overline{\alpha}$ be?}.
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We seek to bound $|\overline{\alpha}-\alpha|$.
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Quantization can be treated by noting that applying the floor function
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to an input introduces an error $\in (-1,0]$, i.e.
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:06}
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\lfloor x \rfloor = x + \varepsilon; \;\; \varepsilon \in (-1,0].
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\end{equation}
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Using this observation, we can rewrite
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(\ref{eq:csoc1:srcs0:soeq0:spsa0:05b}) as
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:07}
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\overline{\alpha}
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=
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\frac{N_{ADP} r_{ADS}}{N_{ADS} r_{ADP}}
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=
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\frac{(\overline{N_{ADP}} + \varepsilon_1) r_{ADS}}{(\overline{N_{ADS}} + \varepsilon_2) r_{ADP}} ;
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\;\;
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\varepsilon_1, \varepsilon_2 \in (-1, 0].
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\end{equation}
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\noindent{}It can be seen from
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(\ref{eq:csoc1:srcs0:soeq0:spsa0:07})
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that the minimum value of the estimate
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$\overline{\alpha}$ occurs when $\varepsilon_1$ is minimized and
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$\varepsilon_2$ is maximized. Similarly, the maximum
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value occurs when $\varepsilon_1$ is maximized and
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$\varepsilon_2$ is minimized. These observations lead to this
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inequality:
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:08}
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\frac{N_{ADP} r_{ADS}}{(N_{ADS}+1) r_{ADP}}
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<
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\alpha
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<
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\frac{(N_{ADP}+1) r_{ADS}}{r_{ADP}} .
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\end{equation}
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Intuitively, the form of (\ref{eq:csoc1:srcs0:soeq0:spsa0:08})
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makes sense. The smallest possible value of $\alpha$ will correspond
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to the case
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when $N_{ADP}$ contains no quantization error but $N_{ADS}$ contains
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a quantization error of nearly 1.
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The largest possible value of $\alpha$ will correspond
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to the case
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when $N_{ADS}$ contains no quantization error but $N_{ADP}$ contains
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a quantization error of nearly 1.
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It can also be seen from (\ref{eq:csoc1:srcs0:soeq0:spsa0:08}) that
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the interval to which $\alpha$ is confined will be larger
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when $V_S$ is smaller (implying a smaller $N_{ADS}$ and $N_{ADP}$).
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This is also intuitively plausible, since the quantization error
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of up to one count in $N_{ADS}$ or $N_{ADP}$ will have a larger
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relative significance when $N_{ADS}$ and $N_{ADP}$ are smaller.
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The inequality provided in (\ref{eq:csoc1:srcs0:soeq0:spsa0:08})
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is certainly useful, and gives insight into quantization error. However,
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we seek an inequality that is more friendly to engineering work, i.e.
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one that involves voltages rather than A/D counts.
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Assume it is known for an application that $V_S$ can vary only over the
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interval
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:08b}
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V_S \in [V_{SMIN}, V_{SMAX}],
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\end{equation}
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\noindent{}and that $\alpha$ can very only over
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the interval
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:08c}
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\alpha \in [\alpha_{MIN}, \alpha_{MAX}].
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\end{equation}
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\noindent{}Furthermore, we
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seek useful inequalities where is it \emph{not} required
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that\footnote{(\ref{eq:csoc1:srcs0:soeq0:spsa0:09}) represents the
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requirement that $V_{SMIN}$ or $V_{SMAX}$ represent a precisely
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integral number of A/D
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counts. This requirement is almost never met in practical engineering
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work.}
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:09}
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r_{ADS} \vworkdivides \{V_{SMIN},V_{SMAX}\},
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\end{equation}
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\noindent{}as if (\ref{eq:csoc1:srcs0:soeq0:spsa0:09})
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were required, it would introduce extra complexity
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in applying the inequality.
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To develop the desired type of inequality, we can use
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a different analysis method. Assume that
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$r_{ADS}$ and $r_{ADP}$ are fixed. Then, introduce
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the function
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:10}
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F(\overline{N_{ADP}}, \overline{N_{ADS}})
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=
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\frac{\overline{N_{ADP}} r_{ADS}}{\overline{N_{ADS}} r_{ADP}},
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\end{equation}
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\noindent{}which, in accordance with (\ref{eq:csoc1:srcs0:soeq0:spsa0:05}),
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is a perfect estimate of $\alpha$.
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\begin{figure}
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\centering
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\Huge{TBD}
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\caption{Sample Staircase Pattern Of Estimate $\overline{\alpha}$ Of
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Prototype Ratiometric Conversion System I}
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\label{fig:csoc1:srcs0:soeq0:spsa0:02}
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\end{figure}
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We can examine the staircase pattern of $\overline{\alpha}$ as
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$V_S$ is increased (see Figure \ref{fig:csoc1:srcs0:soeq0:spsa0:02},
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which provides an example staircase pattern). Note that the staircase
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pattern may contain four qualitatively
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distinct types of vertical discontinuities. In the descriptions below,
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assume that $V_D \in [V_{SMIN}, V_{SMAX}]$ is the value of
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$V_S$ at the discontinuity.
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\begin{itemize}
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\item \textbf{Downward overshoot discontinuities (DOD):}
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As $V_S$ is increased, these correspond to the values
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of $V_S$ where $V_S r_{ADS} \in \vworkintset$ but
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$V_S \alpha r_{ADS} \notin \vworkintset$. At such
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discontinuities,
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$\lim_{V_S \rightarrow V_D^-}\overline{\alpha} > \alpha$,
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but
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$\lim_{V_S \rightarrow V_D^+}\overline{\alpha} < \alpha$.
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\item \textbf{Upward overshoot discontinuities (UOD):}
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As $V_S$ is increased, these correspond to the values
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of $V_S$ where $V_S r_{ADS} \notin \vworkintset$ but
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$V_S \alpha r_{ADS} \in \vworkintset$. At such
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discontinuities,
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$\lim_{V_S \rightarrow V_D^-}\overline{\alpha} < \alpha$,
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but
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$\lim_{V_S \rightarrow V_D^+}\overline{\alpha} > \alpha$.
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\item \textbf{Downward exact discontinuities (DED):}
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As $V_S$ is increased, these correspond to the values
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of $V_S$ where $V_S r_{ADS} \in \vworkintset$ and
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$V_S \alpha r_{ADS} \in \vworkintset$. At such
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discontinuities,
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$\lim_{V_S \rightarrow V_D^-}\overline{\alpha} > \alpha$,
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but
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$\lim_{V_S \rightarrow V_D^+}\overline{\alpha} = \alpha$.
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\item \textbf{Upward exact discontinuities (UED):}
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As $V_S$ is increased, these correspond to the values
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of $V_S$ where $V_S r_{ADS} \in \vworkintset$ and
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$V_S \alpha r_{ADS} \in \vworkintset$. At such
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discontinuities,
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$\lim_{V_S \rightarrow V_D^-}\overline{\alpha} < \alpha$,
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but
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$\lim_{V_S \rightarrow V_D^+}\overline{\alpha} = \alpha$.
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\end{itemize}
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We can place upper bounds on the magnitudes of the discontinuities
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by examining the partial derivatives of
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$F(\overline{N_{ADP}}, \overline{N_{ADS}})$ as specified in
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(\ref{eq:csoc1:srcs0:soeq0:spsa0:10}), specifically:
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:11}
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\frac{\partial{}F(\cdot{},\cdot{})}{\partial \overline{N_{ADS}}}
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=
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-
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\frac{\overline{N_{ADP}} r_{ADS}}{\overline{N_{ADS}^2} r_{ADP}}
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\end{equation}
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:11b}
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\frac{\partial{}^2 F(\cdot{},\cdot{})}{\partial \overline{N_{ADS}}^2}
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=
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2
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\frac{\overline{N_{ADP}} r_{ADS}}{\overline{N_{ADS}^3} r_{ADP}}
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\end{equation}
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\begin{equation}
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\label{eq:csoc1:srcs0:soeq0:spsa0:11c}
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\frac{\partial{}^i F(\cdot{},\cdot{})}{\partial \overline{N_{ADS}}^i}
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=
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(-1)^i (i!)
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\frac{\overline{N_{ADP}} r_{ADS}}{\overline{N_{ADS}^{i+1}} r_{ADP}}
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\end{equation}
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\begin{equation}
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428 |
\label{eq:csoc1:srcs0:soeq0:spsa0:12}
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429 |
\frac{\partial{}F(\cdot{},\cdot{})}{\partial \overline{N_{ADP}}}
|
430 |
=
|
431 |
-
|
432 |
\frac{r_{ADS}}{\overline{N_{ADS}} r_{ADP}}
|
433 |
\end{equation}
|
434 |
|
435 |
\begin{equation}
|
436 |
\label{eq:csoc1:srcs0:soeq0:spsa0:12b}
|
437 |
\frac{\partial{}^i F(\cdot{},\cdot{})}{\partial \overline{N_{ADP}}^i}
|
438 |
=
|
439 |
0, \; i \geq 2
|
440 |
\end{equation}
|
441 |
|
442 |
A \emph{DOD} (discussed above) corresponds to the case where
|
443 |
$N_{ADS}$ increases by one count at $V_S=V_D$ without an increase in
|
444 |
$N_{ADP}$.
|
445 |
|
446 |
|
447 |
A \emph{UOD} (discussed above) corresponds to the case where
|
448 |
$N_{ADP}$ increases by one count at $V_S=V_D$ without an increase in
|
449 |
$N_{ADS}$.
|
450 |
|
451 |
|
452 |
|
453 |
|
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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455 |
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
|
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
|
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\section{Motion Control Systems}
|
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|
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|
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
|
461 |
\vfill
|
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\noindent\begin{figure}[!b]
|
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\noindent\rule[-0.25in]{\textwidth}{1pt}
|
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\begin{tiny}
|
465 |
\begin{verbatim}
|
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$RCSfile: c_soc1.tex,v $
|
467 |
$Source: /home/dashley/cvsrep/e3ft_gpl01/e3ft_gpl01/dtaipubs/esrgubka/c_soc1/c_soc1.tex,v $
|
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$Revision: 1.7 $
|
469 |
$Author: dtashley $
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$Date: 2002/04/21 22:50:04 $
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471 |
\end{verbatim}
|
472 |
\end{tiny}
|
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\noindent\rule[0.25in]{\textwidth}{1pt}
|
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\end{figure}
|
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|
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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% $Log: c_soc1.tex,v $
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% Revision 1.7 2002/04/21 22:50:04 dtashley
|
479 |
% Safety checkin before working on laptop.
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%
|
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% Revision 1.6 2002/04/13 08:18:43 dtashley
|
482 |
% Edits from laptop.
|
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%
|
484 |
% Revision 1.5 2002/04/13 06:04:32 dtashley
|
485 |
% Safety checkin before resuming work on laptop.
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%
|
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% Revision 1.4 2002/04/12 23:41:50 dtashley
|
488 |
% Safety checkin before major editorial additions.
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%
|
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% Revision 1.3 2002/04/10 06:12:33 dtashley
|
491 |
% Evening safety checkin.
|
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%
|
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% Revision 1.2 2002/04/09 23:32:20 dtashley
|
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% Edits, preparing for addition of lists of tables and figures.
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%
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% Revision 1.1 2001/08/25 22:51:26 dtashley
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% Complex re-organization of book.
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%
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%End of file C_PCO0.TEX
|